Microelectromechanical systems

Results: 938



#Item
41Management of Voids in Processing of Bonded Wafers Dr. Shari Farrens, Chief Scientist, EV Group Inc. Dr. Lawrence W. Kessler, President, Sonoscan, Inc. Abstract This paper discusses the origination and detection of bondi

Management of Voids in Processing of Bonded Wafers Dr. Shari Farrens, Chief Scientist, EV Group Inc. Dr. Lawrence W. Kessler, President, Sonoscan, Inc. Abstract This paper discusses the origination and detection of bondi

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Source URL: www.sonoscan.com

Language: English - Date: 2016-07-20 11:09:32
42http://www.nanowerk.com/spotlight/spotid=40x.php

http://www.nanowerk.com/spotlight/spotid=40x.php

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Source URL: rogers.matse.illinois.edu

Language: English - Date: 2009-12-05 16:24:04
43FINAL PROGRAMJune 2016 University of Graz (AULA) Universitätsplatz 3, 8010 Graz /Austria

FINAL PROGRAMJune 2016 University of Graz (AULA) Universitätsplatz 3, 8010 Graz /Austria

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Source URL: www.nanofis.net

Language: English - Date: 2016-06-16 10:19:36
44Fraunhofer  IMS F RAU N HOF E R I NST I T U T E F O R M IC RO E L EC T RO N I C C I RCU I T S A N D SYS T E MS I MS

Fraunhofer IMS F RAU N HOF E R I NST I T U T E F O R M IC RO E L EC T RO N I C C I RCU I T S A N D SYS T E MS I MS

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Source URL: www.ims.fraunhofer.de

Language: English - Date: 2016-08-18 14:28:44
45Varna, Bulgaria - 27 November, 2015: Hyundai Robex 210LC-9 Crawler Excavator on a field. The R210LC-9 has horizontal reach of 10,9 m and dregding depth of 7,7 m.

Varna, Bulgaria - 27 November, 2015: Hyundai Robex 210LC-9 Crawler Excavator on a field. The R210LC-9 has horizontal reach of 10,9 m and dregding depth of 7,7 m.

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Source URL: www.memsic.com

Language: English - Date: 2016-04-22 13:19:31
46 Opening: Post-Doctoral Scholar Institution: California Institute of Technology Starting Date: Available Immediately

Opening: Post-Doctoral Scholar Institution: California Institute of Technology Starting Date: Available Immediately

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Source URL: ese.caltech.edu

Language: English - Date: 2016-08-09 16:27:12
47AVVISO DI SEMINARIO Il giorno venerdi 10 maggio 2013 alle ore 11,00 presso l’Area della Ricerca di Pisa, Aula 44, primo piano, Edificio “A” il Dr Giuseppe d’Arrigo  Istituto per la Microelettronica e Micros

AVVISO DI SEMINARIO Il giorno venerdi 10 maggio 2013 alle ore 11,00 presso l’Area della Ricerca di Pisa, Aula 44, primo piano, Edificio “A” il Dr Giuseppe d’Arrigo  Istituto per la Microelettronica e Micros

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Source URL: www.ino.it

Language: English - Date: 2013-06-12 06:55:52
48EUROPRACTICE  Improving access to hightech nanoelectronics design tools and technologies Carl Das provides some insights into his work building the academic capacity of state-of-the-art nanoelectronics technologies, and

EUROPRACTICE Improving access to hightech nanoelectronics design tools and technologies Carl Das provides some insights into his work building the academic capacity of state-of-the-art nanoelectronics technologies, and

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Source URL: www.europractice-ic.com

Language: English - Date: 2016-02-01 07:11:41
49FEMTO  Combined Electro-Mechanical MEMS Testing  FT-MPS02

FEMTO Combined Electro-Mechanical MEMS Testing FT-MPS02

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Source URL: www.femtotools.com

Language: English - Date: 2014-11-19 10:32:59
50Measurement_curves_buckling_sample_1

Measurement_curves_buckling_sample_1

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Source URL: www.femtotools.com

Language: English - Date: 2014-11-19 10:33:14